Shimadzu XRD-6000 X-ray Diffractometer

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Product Overview

Shimadzu X-ray Diffractometer Model XRD-6000

Manufactured by Shimadzu this model XRD-6000 is used in the laboratory to analyze crystalline states. A laboratory X-ray diffractometer is a powerful analytical instrument widely used in various research fields and industries. This versatile tool is primarily utilized to determine the crystallographic structure of materials by analyzing their diffraction patterns. X-ray diffractometers are particularly essential in fields such as materials science, geology, chemistry, and pharmaceuticals, where understanding the atomic arrangement of crystalline substances is crucial. By exposing samples to X-rays and measuring the resulting diffraction patterns, scientists and researchers can identify the crystal lattice arrangement, lattice parameters, and crystal symmetry. This valuable information helps in characterizing materials, identifying unknown substances, and studying phase transformations in materials. X-ray diffractometers play a vital role in quality control, research, and development processes, enabling advancements in various industries through the detailed analysis of crystalline structures and materials properties.

Specifications for the Shimadzu XRD-600

Item XRD-6000 2kW 

Type Cu, NF type Cu, BF type
Focus 1.0 x 10mm 2.0 x 12mm
Max. output 2kW 
X-ray generator
Max. output 3kW
Output stability ±0.01% (for 10% power fluctuations)
Max. tube voltage 60kV
Max. tube current 80mA
Voltage step width 1kV
Current step width 1mA
Overload limit setting Setting changeable with tube type
X-ray tube protection Against undervoltage, overload, overvoltage, overcurrent and/or failure of water supply
Safety mechanisms Door interlock mechanismʢX-ray can be generated only afterdoor is closedʣEmergency stop
Type Vertical typ
Scanning radius 185mm
Min. step angle 0.002°(2θ) 0.001°(θ)
Angle reproducibility ±0.001˃ (2θ)
Scanning angle range -6°~163° (2θ), -180°~180°(θ)
Scanning system θ/2θ linkage mode, θ, 2θ independent mode
Operation mode Continuous scan measurement, step scan measurement,calibration, positioning,
θ axis oscillation (when using 2θ continuous scan or step scan)
Slewing speed 1000°/minute (2θ)
Scanning speed 0.1°~50°/min (2θ), 0.05°~25°/min (θ)
Divergence slit (DS) 0.5°, 1°, 2°, 0.05mm
Scattering (SS) 0.5°, 1°, 2°
Receiving slit (RS) 0.15mm, 0.3mm

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